On the shape of hot-carrier tails in non-local transport

被引:0
|
作者
Politecnico di Milano, Milano, Italy [1 ]
机构
来源
Semicond Sci Technol | / 11卷 / 1642-1645期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
14
引用
收藏
相关论文
共 50 条
  • [41] BALANCE-EQUATION ANALYSIS OF HOT-CARRIER BLOCH TRANSPORT IN A SUPERLATTICE MINIBAND
    LEI, XL
    HORING, NJM
    CUI, HL
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1992, 4 (47) : 9375 - 9388
  • [42] HOT-CARRIER INSB MICROWAVE MODULATION
    TAN, BTG
    ELECTRONICS LETTERS, 1967, 3 (11) : 504 - &
  • [43] HOT-CARRIER DRIFT VELOCITY IN SILICON
    COSTATO, M
    SCAVO, S
    NUOVO CIMENTO B, 1967, 52 (01): : 236 - &
  • [44] On the Temperature Behavior of Hot-Carrier Degradation
    Tyaginov, S.
    Jech, M.
    Sharma, P.
    Franco, J.
    Kaczer, B.
    Grasser, T.
    2015 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP (IIRW), 2015, : 143 - 146
  • [45] ASYMPTOTIC ELECTRON-ENERGY FLUX EQUATIONS FOR HOT-CARRIER TRANSPORT SIMULATION
    SZETO, S
    REIF, R
    IEEE ELECTRON DEVICE LETTERS, 1987, 8 (08) : 336 - 337
  • [46] Demonstration of a hot-carrier photovoltaic cell
    Dimmock, James A. R.
    Day, Stephen
    Kauer, Matthias
    Smith, Katherine
    Heffernan, Jon
    PROGRESS IN PHOTOVOLTAICS, 2014, 22 (02): : 151 - 160
  • [47] Hot-carrier relaxation in photoinjected ZnSe
    Rodrigues, Cloves G.
    MICROELECTRONICS JOURNAL, 2007, 38 (01) : 24 - 26
  • [48] A HOT-CARRIER ANALYSIS OF SUBMICROMETER MOSFETS
    SANGIORGI, E
    PINTO, MR
    VENTURI, F
    FICHTNER, W
    IEEE ELECTRON DEVICE LETTERS, 1988, 9 (01) : 13 - 16
  • [49] INFLUENCE OF LATTICE SELF-HEATING AND HOT-CARRIER TRANSPORT ON DEVICE PERFORMANCE
    LIANG, MC
    LAW, ME
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (12) : 2391 - 2398
  • [50] HOT-CARRIER RELIABILITY IN SUBMICRON PMOSFETS
    KOYANAGI, M
    HUANG, T
    LEWIS, A
    CHEN, JY
    1989 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONS: PROCEEDINGS OF TECHNICAL PAPERS, 1989, : 312 - 316