Effect of annealing on the structure and dielectric properties of BaxSr1-xTiO3 ferroelectric thin films

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Knauss, L.A.
Pond, J.M.
Horwitz, J.S.
Chrisey, D.B.
Mueller, C.H.
Treece, Randolph
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Applied Physics Letters | 1996年 / 69卷 / 01期
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