TESTING MICROPROCESSOR CHIPS: A LARGE-SCALE CHALLENGE.

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作者
Chrones, Christos
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Electronic Packaging and Production | 1975年 / 15卷 / 4 pt 1期
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SEMICONDUCTOR DEVICE TESTING;
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摘要
Microprocessors are the latest evolutionary step in semiconductor technology, and testing can be performed either by testing the individual components on the chip or by testing the entire chip as a problem-solving system. The self-diagnostic method forces the chip to perform a sequence of worse-case instructions. Another method, known as the comparison method, compares the output of the device with a known-good device. Other methods include algorithmic pattern generation and the more advanced method known as stored response. Details of these methods are outlined.
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页码:35 / 42
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