TESTING MICROPROCESSOR CHIPS: A LARGE-SCALE CHALLENGE.
被引:0
|
作者:
Chrones, Christos
论文数: 0引用数: 0
h-index: 0
Chrones, Christos
机构:
来源:
Electronic Packaging and Production
|
1975年
/
15卷
/
4 pt 1期
关键词:
SEMICONDUCTOR DEVICE TESTING;
D O I:
暂无
中图分类号:
学科分类号:
摘要:
Microprocessors are the latest evolutionary step in semiconductor technology, and testing can be performed either by testing the individual components on the chip or by testing the entire chip as a problem-solving system. The self-diagnostic method forces the chip to perform a sequence of worse-case instructions. Another method, known as the comparison method, compares the output of the device with a known-good device. Other methods include algorithmic pattern generation and the more advanced method known as stored response. Details of these methods are outlined.