High Resolution Electron Microscopy of Amorphous Alloys

被引：0

作者：

Ishida, Yoichi ^{[1
]}

Ichinose, Hideki ^{[1
]}

机构：

[1] Institute of Industrial Science, University of Tokyo, Roppongi, Minato-ku, Tokyo,106, Japan

来源：

Microscopy | 1985年 / 34卷 / 04期

关键词：

The present authors acknowledge the generous cooperation of Professors T. Masumoto and H. Kojima at Tohoku University; Dr. H. Shimizu at Eetectro-technical Laboratory and S. Nanao of the Institute in supplying specimens; Professor S. Karashima at Tohoku University and JEOL laboratory for the opportunity to use high resolution electron microscopes. The work was supported through a special research project Amorphous Material; by a Scientific Grant-in-Aid from the Ministry of Education; Science and Culture; Japan;

D O I：

10.1093/oxfordjournals.jmicro.a050519

中图分类号：

学科分类号：

摘要：

引用

页码：266 / 276

共 50 条

[41] STUDY OF ORDERED ALLOYS BY MEANS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ELECTRON-DIFFRACTION
AMELINCKX, S
CHEMICA SCRIPTA, 1979, 14 (1-5): : 197 - 206
[42] Quantitative High Resolution Electron Microscopy
D. Van Dyck
Microchimica Acta, 2002, 138 : 153 - 180
[43] HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY
CREWE, AV
RADIATION RESEARCH, 1971, 47 (01) : 234 - &
[44] High-resolution electron-microscopy analysis of splitting patterns in Ni alloys
Calderon, HA
Kostorz, G
Calzado-Lopez, L
Kisielowski, C
Mori, T
PHILOSOPHICAL MAGAZINE LETTERS, 2005, 85 (02) : 51 - 59
[45] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DISORDERED AU-MN ALLOYS
TANAKA, N
COWLEY, JM
JOURNAL OF ELECTRON MICROSCOPY, 1985, 34 (03): : 213 - 213
[46] HIGH-RESOLUTION OBSERVATION OF ORDERED ALLOYS BY 1 MV ELECTRON-MICROSCOPY
HIRABAYASHI, M
JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (01): : 74 - 74
[47] CHARACTERIZATION OF PERIODIC ANTIPHASE ALLOYS USING HIGH-RESOLUTION ELECTRON-MICROSCOPY
PORTIER, R
GRATIAS, D
GUYMONT, M
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1980, 5 (03): : A10 - A10
[48] DYNAMICAL DIFFRACTION EFFECTS ON HIGH-RESOLUTION ELECTRON-MICROSCOPY OF ORDERED ALLOYS
SHINDO, D
HIRABAYASHI, M
ACTA CRYSTALLOGRAPHICA SECTION A, 1988, 44 : 954 - 960
[49] CHARACTERIZATION OF INTERNAL INTERFACES IN METALS AND ALLOYS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
PENISSON, JM
REGHEERE, G
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 107 : 199 - 205
[50] RESOLUTION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
OKEEFE, MA
ULTRAMICROSCOPY, 1992, 47 (1-3) : 282 - 297

← 1 2 3 4 5 →