Single electron tunneling in TlBa2(Ca0.8Y0.2)Cu2O7 thin films at 10K

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[1] Miller, T.G.
[2] Reifenberger, R.
[3] McElfresh, M.
[4] Face, D.W.
[5] Holstein, W.L.
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Miller, T.G. | 1600年 / 94期
关键词：
Atomic force microscopy - Scanning tunneling microscopy - Single electron tunneling - Tunnel junctions;
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页码：3 / 4
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