Hierarchical Design and Test of Integrated Microsystems

被引：0
|
作者：
Mukherjee, Tamal [3 ]
Fedder, Gary K. [1 ]
Blanton, R.D. [2 ,3 ]
机构：
[1] University of California, Berkeley, CA, United States
[2] University of Michigan, Ann Arbor, MI, United States
[3] Dept. of Elec. and Comp. Engineering, Carnegie Mellon University, Pittsburgh, PA 15213-3890, United States
来源：
IEEE Design and Test of Computers | / 16卷 / 04期
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页码：18 / 27
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