Reflection measurements of microwave absorbers

被引:0
|
作者
Baker, Dirk E. [1 ]
van der Neut, Cornelis A. [1 ]
机构
[1] EM-Lab (Pty) Ltd, South Africa
来源
Microwave journal | 1988年 / 31卷 / 12期
关键词
Dielectric Materials - Interferometers - Optical Variables Measurement - Waveguide Components;
D O I
暂无
中图分类号
学科分类号
摘要
For certain applications the antenna designer may require a knowledge of the small scale, or localized, reflectivity properties of microwave absorbers. Suppliers of microwave absorbers generally quote the average absorption achieved over fairly large panels (610 × 610 mm) as determined by one of several free-space measurement techniques. By the nature of their construction, small samples of planar absorber panels cannot generally be evaluated directly in waveguide, particularly at X band and above. In this paper, we describe a swept-frequency, one-horn interferometer where the absorber panel is placed directly against the aperture of a well-matched horn.
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