NEW METHOD FOR MEASURING THERMAL EMF.

被引:0
|
作者
Vedernikov, M.V.
机构
关键词
Compendex;
D O I
暂无
中图分类号
学科分类号
摘要
THERMOELECTRICITY
引用
收藏
页码:1585 / 1586
相关论文
共 50 条
  • [11] DEVICE FOR MEASURING THERMAL EMF OF SEMICONDUCTOR-MATERIALS
    LYASHCHENOK, VI
    PLEKHOTKINA, GL
    STREKOPYTOVA, NI
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1976, 19 (05) : 1568 - 1569
  • [12] A NEW METHOD FOR MEASURING THERMAL PROPERTIES OF SOLIDS
    BERTMAN, B
    HEBERLEI.DC
    SANDIFOR.DJ
    SHEN, L
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1970, 15 (01): : 71 - &
  • [13] A new method of measuring thermal contact conductance
    Rosochowska, M
    Chodnikiewicz, K
    Balendra, R
    JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2004, 145 (02) : 207 - 214
  • [14] NEW METHOD OF MEASURING GAS THERMAL CONDUCTIVITY
    WALKER, RE
    DEHAAS, N
    WESTENBERG, AA
    PHYSICS OF FLUIDS, 1960, 3 (03) : 482 - 483
  • [15] NEW METHOD OF MEASURING THERMAL CONDUCTIVITY OF ROCKS
    HORAI, K
    BALDRIDG.S
    TRANSACTIONS-AMERICAN GEOPHYSICAL UNION, 1971, 52 (04): : 353 - &
  • [16] NEW METHOD FOR MEASURING THERMAL-CONDUCTIVITY
    GOLDRATT, E
    GREENFIELD, AJ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (11): : 1531 - 1536
  • [17] New method for measuring thermal sensitivity.
    Toulouse, E
    Vaschide, N
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES, 1900, 130 : 199 - 200
  • [18] An apparatus for measuring the electric conductivity and thermal EMF of semiconductors and their melts
    Magomedov, YB
    Aliev, SN
    Aidamirov, MA
    Lugueva, NV
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2003, 46 (06) : 834 - 837
  • [19] An Apparatus for Measuring the Electric Conductivity and Thermal EMF of Semiconductors and Their Melts
    Ya. B. Magomedov
    S. N. Aliev
    M. A. Aidamirov
    N. V. Lugueva
    Instruments and Experimental Techniques, 2003, 46 : 834 - 837
  • [20] SETUP FOR MEASURING THERMAL EMF OF METALLIC MELTS (EXCHANGE OF EXPERIENCE)
    KOZLOV, VA
    ASANOVIC.VY
    SEMENOV, AN
    SHULGA, LI
    INDUSTRIAL LABORATORY, 1967, 33 (07): : 1072 - &