Investigation of properties of quasi-one-dimensional contacts in scanning tunneling microscopy

被引：0
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作者：
Nevolin, V.K. [1 ]
机构：
[1] Moscow Inst of Electronic, Engineering, Moscow, Russia
来源：
Surface Investigation X-Ray, Synchrotron and Neutron Techniques | 1998年 / 14卷 / 02期
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摘要：
7
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页码：271 / 274
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