共 50 条
- [41] Vibalizer:: A free, web-based tool for rapid, quantitative comparison and analysis of calculated vibrational modesJOURNAL OF COMPUTATIONAL CHEMISTRY, 2007, 28 (07) : 1290 - 1305Grafton, Anthony K.
- [42] Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample methodPROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2015), 2016, 1741Tanaka, MasahikoKatsuya, YoshioSakata, Osami
- [43] Application of powder X-ray diffraction and the Rietveld method to the analysis of oxidation processes and products in sulphidic mine tailingsNEUES JAHRBUCH FUR MINERALOGIE-ABHANDLUNGEN, 2011, 188 (01): : 31 - 47Balic-Zunic, TonciKaterinopoulou, AnnaEdsberg, Anders
- [45] Limits of Visual Detection for Finasteride Polymorphs in Prepared Binary Mixtures: Analysis by X-ray Powder DiffractionJOURNAL OF PHARMACEUTICAL SCIENCES, 2014, 103 (11) : 3567 - 3575Bezzon, Vinicius D. N.Antonio, Selma G.Paiva-Santos, Carlos O.
- [46] A STANDARDLESS X-RAY-DIFFRACTION METHOD FOR THE QUANTITATIVE-ANALYSIS OF MULTIPHASE MIXTURESJOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 : 457 - 460RIUS, JPLANA, FPALANQUES, A
- [47] Qualitative and quantitative analysis of urolithiasis with the Rietveld method (x-ray diffraction) [Genaue qualitative und quantitative harnsteinanalyse mit hilfe der Rietveld-methode (röntgendiffraktion)]Der Urologe, 2008, 47 (11): : 1472 - 1480Euler H.Bastian H.P.Bastian P.J.Lümmen G.
- [48] QUANTITATIVE-ANALYSIS OF BINARY-MIXTURES .1. GENERAL-METHODAPPLIED SPECTROSCOPY, 1981, 35 (04) : 421 - 428DIEM, HEKRIMM, S
- [49] Quantitative Phase Analyses Through The Rietveld Method with X-Ray Powder Diffraction Data of Heat-Treated Carbamazepine Form IIIJOURNAL OF PHARMACEUTICAL SCIENCES, 2011, 100 (07) : 2658 - 2664Antonio, Selma GutierrezBenini, Fernanda RibeiroFerreira, Fabio FurlanPires Rosa, Paulo CesarPaiva-Santos, Carlos De Oliveira
- [50] The effect of data quality and model parameters on the quantitative phase analysis of X-ray diffraction data by the Rietveld methodJOURNAL OF APPLIED CRYSTALLOGRAPHY, 2021, 54 : 878 - 894Rowles, Matthew R.