AUTOMATIC INSPECTION OF MASKS FOR GLASS SUBSTRATES FOR THE PRODUCTION OF SEMICONDUCTOR DEVICES.

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作者：

Anon

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来源：

IBM technical disclosure bulletin | 1986年 / 28卷 / 11期

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摘要：

INTEGRATED CIRCUIT MANUFACTURE

引用

共 50 条

[1] AUTOMATING THE PRODUCTION OF POWER SEMICONDUCTOR DEVICES.
Kyuts, R.V.
Toomsoo, G.K.
Soviet electrical engineering, 1984, 55 (04): : 44 - 51
[2] HOT-DIPPED METAL FILMS AS EPITAXIAL SUBSTRATES FOR LARGE SCALE PRODUCTION OF SEMICONDUCTOR DEVICES.
Anon
Industrial Heating, 1985, 52 (08): : 41 - 42
[3] Automatic visual inspection for glass production
Micheletti, R
ISMCR '98: PROCEEDINGS OF THE EIGHTH INTERNATIONAL SYMPOSIUM ON MEASUREMENT AND CONTROL IN ROBOTICS, 1998, : 127 - 131
[4] COMMUNICATIONS STANDARD FOR INSPECTION DEVICES.
Albert, Mark
1600, (59):
[5] USE OF BF2 + IMPLANTATION IN THE PRODUCTION OF SEMICONDUCTOR DEVICES.
Chernyaev, A.V.
Chernetskii, T.P.
Soviet Microelectronics (English Translation of Mikroelektronika), 1979, 8 (06): : 377 - 380
[6] SOLDER TERMINAL FOR SEMICONDUCTOR DEVICES.
IBM technical disclosure bulletin, 1985, 27 (09):
[7] Measurements of Noise in Semiconductor Devices.
Spiralski, Ludwik
Elektronika Warszawa, 1980, 21 (11): : 15 - 22
[8] FABRICATION OF POWER SEMICONDUCTOR DEVICES.
Tuchkevich, V.M.
Tepman, I.A.
Kovalev, F.I.
Yakivchik, N.I.
Soviet electrical engineering, 1980, 51 (01): : 67 - 75
[9] IDEAS ON MAGNETIC SEMICONDUCTOR DEVICES.
HOPPER, CHARLES
1982, V 15 (N 20):
[10] INCOMING INSPECTION OF ANALOG/DIGITAL DEVICES.
Markstein, Howard W.
Electronic Packaging and Production, 1981, 21 (02): : 63 - 74