Fast measurement spherical surface and fast patching up aspherical surface

被引：0
|
作者：
Cao, Tianning [1 ]
Zheng, Weimin [1 ]
Bai, Jian [1 ]
Zhou, Shuwen [1 ]
机构：
[1] Zhejiang Univ, Hangzhou, China
来源：
Guangxue Jishu/Optical Technique | 1998年 / 03期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
页码：31 / 33
相关论文
共 50 条
  • [21] Surface channeling of fast ions
    Mannami, M
    Kimura, K
    Narumi, K
    Yamamoto, M
    Naito, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 125 (1-4): : 97 - 101
  • [22] White light interferometry for fast areal surface measurement based on GPGPU
    Wang, Jing
    Wang, Kaiwei
    Zhao, Shuangshuang
    Lin, Li
    Bai, Jian
    OPTICAL DESIGN AND TESTING IV, 2010, 7849
  • [23] Fast Calibration Based Photometric Stereo for Multiscale Metallic Surface Measurement
    Ma, Long
    Liu, Xu
    Liu, Yuzhe
    Guo, Shengwei
    Li, Wenjie
    OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS X, 2023, 12769
  • [24] Fast and precise surface measurement of back-grinding silicon wafers
    OptoSurf GmbH, Germany
    不详
    Solid State Technol, 4 (18-23):
  • [25] Fast and precise surface measurement of back-grinding silicon wafers
    Brodmann, R.
    Brodmann, B.
    Konovalenko, K.
    Wiehr, C.
    Huang, Ching-Hsien
    Chen, Ya-Leng
    SOLID STATE TECHNOLOGY, 2017, 60 (04) : 18 - 23
  • [26] Shadow moire technology based fast method for the measurement of surface topography
    Zhao, Hong
    Du, Hubing
    Li, Jing
    Qin, Yuwei
    APPLIED OPTICS, 2013, 52 (33) : 7874 - 7881
  • [27] High Accuracy Measurement of Aspherical Surface by Point Diffraction Interferometry
    Gao, Fen
    Jiang, Zhuangde
    Feng, Yi
    Li, Bing
    2014 IEEE 14TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO), 2014, : 428 - 432
  • [28] Eyepiece of aspherical surface
    Anhui Inst of Optical & Fine, Mechanics, Chinese Acad of Science, Hefei, China
    Guangxue Xuebao, 10 (1389-1393):
  • [29] Increase in the measurement of the normal vectors of an aspherical surface used in deflectometry
    Castan-Ricano, Diana
    Granados-Agustin, Fermin S.
    Percino-Zacarias, E.
    Cornejo-Rodriguez, A.
    MODELING ASPECTS IN OPTICAL METROLOGY VI, 2017, 10330
  • [30] Fast analysis of electromagnetic properties of surface/surface configurations
    Wang X.
    Gong S.
    Wang W.
    Zhang Y.
    Xi'an Dianzi Keji Daxue Xuebao/Journal of Xidian University, 2011, 38 (04): : 106 - 111
12345