Thickness Dependence of Infrared Optical Properties of LaNiO3 Thin Films Prepared on Platinized Silicon Substrates

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[1] Hu, Zhigao
[2] Meng, Xiangjian
[3] Huang, Zhiming
[4] Wang, Genshui
[5] Zhao, Qiang
[6] Chu, Junhao
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Hu, Z. (zhigaohu@mail.sitp.ac.cn) | 1600年 / Japan Society of Applied Physics卷 / 42期
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