TEMPERATURE DISTRIBUTION AND SAFE OPERATING AREA FOR BIPOLAR TRANSISTORS.

被引：0
|
作者：
Zeng Qingming [1 ]
机构：
[1] Hebei Semiconductor Research Inst, China, Hebei Semiconductor Research Inst, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1985年 / 6卷 / 06期
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摘要：
5
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页码：611 / 619
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