High-temperature, high-sensitivity moire interferometry

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[1] Czarnek, R.
[2] Wu, J.J.
[3] Lin, S.Y.
[4] Lee, J.
来源：
Czarnek, R. | 1600年 / Publ by SEM - Soc for Experimental Mechanics, Inc., Bethel, CT, United States卷 / 17期
关键词：
High sensitivity - Moire interferometry;
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