Mechanism of negative-bias temperature instability in polycrystalline-silicon thin film transistors

被引：0
|
作者：
机构：
来源：
| 1600年 / American Inst of Physics, Woodbury, NY, USA卷 / 76期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes
    Tu, Hong-Yi
    Tsao, Yu-Ching
    Tai, Mao-Chou
    Chang, Ting-Chang
    Tsai, Yu-Lin
    Huang, Shin-Ping
    Zheng, Yu-Zhe
    Wang, Yu-Xuan
    Chen, Hong-Chih
    Tsai, Tsung-Ming
    Wu, Chia-Chuan
    IEEE ELECTRON DEVICE LETTERS, 2019, 40 (11) : 1768 - 1771
  • [42] Enhanced Negative-Bias Illumination Temperature Stability of Praseodymium-Doped InGaO Thin-Film Transistors
    Zhu, Yubo
    Xu, Hua
    Xu, Miao
    Li, Min
    Zou, Jianhua
    Tao, Hong
    Wang, Lei
    Peng, Junbiao
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2021, 218 (14):
  • [43] Unified Mechanism for Positive- and Negative-Bias Temperature Instability in GaN MOSFETs
    Guo, Alex
    del Alamo, Jesus A.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (05) : 2142 - 2147
  • [44] Analytical current-voltage model for polycrystalline-silicon thin-film transistors
    Kimura, M
    Takizawa, T
    Inoue, S
    Shimoda, T
    APPLIED PHYSICS LETTERS, 2002, 80 (13) : 2326 - 2328
  • [45] Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistors
    Chen, Chih-Yang
    Lee, Jam-Wem
    Ma, Ming-Wen
    Chen, Wei-Cheng
    Lin, Hsiao-Yi
    Yeh, Kuan-Lin
    Wang, Shen-De
    Lei, Tan-Fu
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2007, 154 (08) : H704 - H707
  • [46] Progress in fabrication technologies of polycrystalline-silicon thin-film transistors at low temperatures
    Sameshima, T
    JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2005, 13 (03) : 233 - 239
  • [47] Subthreshold conduction in short-channel polycrystalline-silicon thin-film transistors
    Chopra, S
    Gupta, RS
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2000, 15 (02) : 197 - 202
  • [48] Negative Bias Temperature Instability Dominated Degradation of Metal-Induced Laterally Crystallized p-Type Polycrystalline Silicon Thin-Film Transistors
    Hu, Chunfeng
    Wang, Mingxiang
    Zhang, Bo
    Wong, Man
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2009, 56 (04) : 587 - 594
  • [49] The role of hydrogen migration in negative-bias temperature instability
    Ushio, J
    Watanabe, K
    Kushida-Abdelghafar, K
    Maruizumi, T
    APPLIED SURFACE SCIENCE, 2003, 216 (1-4) : 258 - 263
  • [50] Conduction mechanism of polycrystalline silicon thin-film transistors
    Saito, Yoji
    Abe, Kazuhiko
    Kawamoto, Chinami
    Kuwano, Hiroshi
    Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi), 1988, 71 (06): : 1 - 8
12345