Transformation of electromagnetic wave polarization by the resonance in a thin solid-plasma film

被引：0
|
作者：
Bakunov, M.I. [1 ]
Zhukov, S.N. [1 ]
机构：
[1] Univ of Nizhny Novgorod, Nizhny Novgorod, Russia
来源：
| 1996年 / VSP Int Sci Publ, Zeist, Netherlands卷 / 10期
关键词：
Carrier concentration - Magnetic field effects - Magnetostatics - Natural frequencies - Resonance - Semiconductor plasmas - Thin films;
D O I：
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中图分类号：
学科分类号：
摘要：
The results of theoretical investigation on transformation of the character of polarization of electromagnetic wave under reflection from thin (comparing to the wavelength) solid-plasma (semiconductor) film are presented. The phenomenon of strong transformation is pointed out to occur when the wave frequency is close to the frequency of plasma resonance in the film. Various regimes of the transformation are studied. Influence of externally applied magnetostatic field and film inhomogeneity is investigated as well.
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