共 50 条
- [45] Decomposition methods for optimal allocation of large-system reliability Xi Tong Cheng Yu Dian Zi Ji Shu/Syst Eng Electron, 4 (63-67):
- [48] USE OF A TIN BARRIER TO IMPROVE GaAs FET OHMIC CONTACT RELIABILITY. Electron device letters, 1985, EDL-6 (08): : 437 - 438
- [50] MODELS AND METHODS FOR INVESTIGATION OF ENERGY-SYSTEM RELIABILITY. Power engineering New York, 1985, 23 (05): : 44 - 52