X-RAY PHOTOELECTRON SPECTROSCOPY OF THERMALLY TREATED SiO2 SURFACES.

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作者：
Miller, Mark L. [1 ]
Linton, Richard W. [1 ]
机构：
[1] Univ of North Carolina, Dep of, Chemistry, Chapel Hill, NC, USA, Univ of North Carolina, Dep of Chemistry, Chapel Hill, NC, USA
来源：
| 1985年 / 57期
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32
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