Real-time monitoring of growth parameters of MBE grown HgCdTe

被引:0
|
作者
Wang, Shanli [1 ]
Yu, Meifang [1 ]
Qiao, Yimin [1 ]
Yang, Jianrong [1 ]
Wu, Yan [1 ]
Yuan, Shixin [1 ]
He, Li [1 ]
机构
[1] Shanghai Inst of Technique Physics, Chinese Acad of Sciences, Shanghai, China
关键词
D O I
暂无
中图分类号
学科分类号
摘要
(Edited Abstract)
引用
收藏
页码:287 / 291
相关论文
共 50 条
  • [41] REAL-TIME MONITORING
    Thayer, Ann M.
    CHEMICAL & ENGINEERING NEWS, 2014, 92 (47) : 8 - 12
  • [42] Real-Time Monitoring System Using IoT for Photovoltaic Parameters
    Asnil, Asnil
    Krismadinata, Krismadinata
    Husnaini, Irma
    Hazman, Hanif
    Astrid, Erita
    TEM JOURNAL-TECHNOLOGY EDUCATION MANAGEMENT INFORMATICS, 2023, 12 (03): : 1316 - 1322
  • [43] Real-time Monitoring of Behavioural Parameters Related to Psychological Stress
    Giakoumis, Dimitris
    Drosou, Anastasios
    Cipresso, Pietro
    Tzovaras, Dimitrios
    Hassapis, George
    Gaggioli, Andrea
    Riva, Giuseppe
    ANNUAL REVIEW OF CYBERTHERAPY AND TELEMEDICINE, 2012, 10 : 287 - 291
  • [44] Real-time monitoring of behavioural parameters related to psychological stress
    Giakoumis, Dimitris
    Drosou, Anastasios
    Cipresso, Pietro
    Tzovaras, Dimitrios
    Hassapis, George
    Gaggioli, Andrea
    Riva, Giuseppe
    Studies in Health Technology and Informatics, 2012, 181 : 287 - 291
  • [45] APPLICATION OF SPECTROSCOPIC ELLIPSOMETRY FOR REAL-TIME CONTROL OF CDTE AND HGCDTE GROWTH IN AN OMCVD SYSTEM
    MURTHY, SD
    BHAT, IB
    JOHS, B
    PITTAL, S
    HE, P
    JOURNAL OF ELECTRONIC MATERIALS, 1995, 24 (05) : 445 - 449
  • [46] REAL-TIME MONITORING OF III-V ALLOY COMPOSITION AND REAL-TIME CONTROL OF QUANTUM-WELL THICKNESS IN MBE BY MULTIWAVELENGTH ELLIPSOMETRY
    KUO, CH
    ANAND, S
    DROOPAD, R
    MATHINE, DL
    MARACAS, GN
    JOHS, B
    HE, P
    WOOLLAM, JA
    LEVOLA, T
    COMPOUND SEMICONDUCTORS 1994, 1995, (141): : 29 - 34
  • [47] Influence of growth parameters and annealing on properties of MBE grown GaAsSbNSQWs
    Wu, LJ
    Iyer, S
    Nunna, K
    Bharatan, S
    Li, J
    Collis, WJ
    Micro- and Nanosystems-Materials and Devices, 2005, 872 : 453 - 460
  • [48] Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multi-wavelength ellipsometry
    J.A. Woollam Co, Lincoln, United States
    Mater Sci Eng B Solid State Adv Technol, 1-3 (134-138):
  • [49] Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multi-wavelength ellipsometry
    Johs, B
    Herzinger, C
    He, P
    Pittal, S
    Woollam, J
    Wagner, T
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 44 (1-3): : 134 - 138
  • [50] Arsenic incorporation during MBE growth of HgCdTe
    Berding, MA
    Sher, A
    JOURNAL OF ELECTRONIC MATERIALS, 1999, 28 (06) : 799 - 803