Thermal nitridation of Si(111) surfaces with N2 molecules studied by X-ray photoelectron spectroscopy

被引：0
|
作者：
机构：
[1] Tabe, Michiharu
来源：
Tabe, Michiharu | 1600年 / JJAP, Minato-ku, Japan卷 / 34期
关键词：
Semiconducting silicon;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Angle-resolved X-ray photoelectron spectroscopy intensity modeling of SiNx ultrathin layer grown on Si (100) and Si (111) substrates by N2 plasma treatment
    Beji, Hiba
    Develay, Valentin
    Monier, Guillaume
    Bideux, Luc
    Hoggan, Philip E.
    Bousquet, Angelique
    Tomasella, Eric
    Robert-Goumet, Christine
    THIN SOLID FILMS, 2024, 798
  • [22] Deprotonation of Glyphosate Studied with X-ray Photoelectron Spectroscopy
    Rodriguez, L. M.
    Pedano, M. L.
    Albornoz, M.
    Fuhr, J. D.
    Martiarena, M. L.
    Zampieri, G.
    MATERIALS TODAY-PROCEEDINGS, 2019, 14 : 117 - 121
  • [23] Clean and hydroxylated rutile TiO2(110) surfaces studied by X-ray photoelectron spectroscopy
    Bullock, EL
    Patthey, L
    Steinemann, SG
    SURFACE SCIENCE, 1996, 352 : 504 - 510
  • [24] Lithiation of Single-Crystalline Ge(111) and Si(111) Investigated by X-ray Photoelectron Spectroscopy
    Liu, Zhen
    Borodin, Andriy
    Liu, Xiaoxu
    Li, Yao
    Endres, Frank
    JOURNAL OF PHYSICAL CHEMISTRY C, 2021, 125 (24): : 13501 - 13507
  • [25] Study of InP(100) surface nitridation by x-ray photoelectron spectroscopy
    Bideux, L
    Ould-Metidji, Y
    Gruzza, B
    Matolin, V
    SURFACE AND INTERFACE ANALYSIS, 2002, 34 (01) : 712 - 715
  • [26] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF SI(111) AND SI(100) SURFACES WITH CHEMICALLY ADSORBED BROMINE
    SEKAR, K
    KURI, G
    MAHAPATRA, DP
    DEV, BN
    RAMANA, JV
    KUMAR, S
    RAJU, VS
    SURFACE SCIENCE, 1994, 302 (1-2) : 25 - 36
  • [27] Lithiation of Single-Crystalline Ge(111) and Si(111) Investigated by X-ray Photoelectron Spectroscopy
    Liu, Zhen (zhen.liu@tu-clausthal.de); Endres, Frank (frank.endres@tu-clausthal.de), 1600, American Chemical Society (125):
  • [28] Local atomic configuration in laser synthesized Si/C/N powders studied by X-ray photoelectron spectroscopy
    Gheorghiu, A
    Dufour, G
    Senemaud, C
    Herlin, N
    Musset, E
    Cauchetier, M
    Armand, X
    JOURNAL DE PHYSIQUE III, 1997, 7 (03): : 529 - 535
  • [29] In situ characterization of the nitridation of AIII-BV semiconductor surfaces by means of X-ray photoelectron spectroscopy
    Hecht, JD
    Frost, F
    Chassé, T
    Hirsch, D
    Neumann, H
    Schindler, A
    Bigl, F
    APPLIED SURFACE SCIENCE, 2001, 179 (1-4) : 196 - 202
  • [30] Electronic structure of acetylene on Si(111)-7x7: X-ray photoelectron and x-ray absorption spectroscopy
    Rochet, F
    Dufour, G
    Prieto, P
    Sirotti, F
    Stedile, FC
    PHYSICAL REVIEW B, 1998, 57 (11): : 6738 - 6748
12345