Spectrometer for polarized soft X-ray Raman scattering

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Synchrotron Radiation Laboratory, Institute for Solid State Physics, University of Tokyo, Tanashi, Tokyo 188, Japan [1 ]
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J. Synchrotron Radiat. | / 3卷 / 1013-1015期
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An experimental system for polarized soft X-ray Raman scattering spectroscopy has been constructed. The soft X-ray spectrometer is based on the Rowland circle geometry with a holographic spherical grating. Three types of gratings are used to cover the energy range from 18 eV to 1200 eV. According to a raytrace simulation, the resolution is expected to be 200 meV at 700 eV by using a 10 μm slit width. The polarized and depolarized soft X-ray Raman scattering spectra can be measured by rotating the soft X-ray spectrometer around the axis of the incident beam. Preliminary measurements of polarized and depolarized spectra were accomplished at undulator beamline BL-2C of the Photon Factory.
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