Soft matter structure measurement by polarized resonant soft X-ray scattering

被引：0
|
作者：
DeLongchamp, Dean [1 ]
机构：
[1] NIST, Gaithersburg, MD 20899 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2018年 / 256卷
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
199
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页数：2
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