Precision Lattice Spacing Measurements Using X-Ray Cn Ka Doublet

被引:0
|
作者
Fukumori, T.
Imai, K.
Hasegawa, T.
Akashi, Y.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
下载
收藏
相关论文
共 50 条
  • [31] PRECISION MEASUREMENT OF LATTICE CONSTANTS FROM BROADENED X-RAY LINES
    GOLOVCHI.YM
    INDUSTRIAL LABORATORY, 1965, 30 (06): : 893 - &
  • [32] Lattice dynamics of vanadium: Inelastic x-ray scattering measurements
    Bosak, Alexey
    Hoesch, Moritz
    Antonangeli, Daniele
    Farber, Daniel L.
    Fischer, Irmengard
    Krisch, Michael
    PHYSICAL REVIEW B, 2008, 78 (02):
  • [33] DSC and X-ray measurements as methods to detect lattice distortions
    Sigrist, K
    THERMOCHIMICA ACTA, 1998, 311 (1-2) : 213 - 216
  • [34] LATTICE DEFORMATION MEASUREMENTS VIA "ON SITE X-RAY DIFFRACTION"
    Berti, G.
    De Marco, F.
    Del Seppia, M. E.
    POWDER DIFFRACTION, 2013, 28 : S209 - S219
  • [35] DOUBLET FORMATION IN X-RAY SPARK SPECTRA
    RAI, S
    JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH, 1977, 36 (12): : 655 - 661
  • [36] Mapping Lattice Spacing and Composition in Biological Materials by Means of Microbeam X-Ray Diffraction
    Paris, Oskar
    Aichmayer, Barbara
    Al-Sawalmih, Ali
    Li, Chenghao
    Siegel, Stefan
    Fratzl, Peter
    ADVANCED ENGINEERING MATERIALS, 2011, 13 (08) : 784 - 792
  • [37] Lattice spacing changes with contraction in skinned rat trabeculae as determined by X-ray diffraction
    Farman, GP
    Smith, SH
    de Tombe, PP
    Irving, TC
    BIOPHYSICAL JOURNAL, 2002, 82 (01) : 397A - 397A
  • [38] MEASUREMENTS ON LOCAL VARIATIONS IN SPACING AND ORIENTATION OF LATTICE PLANE OF SILICON SINGLE CRYSTALS BY X-RAY DOUBLE-CRYSTAL TOPOGRAPHY
    KIKUTA, S
    KOHRA, K
    SUGITA, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1966, 5 (11) : 1047 - &
  • [39] INTERSTITIAL CONTENT OF RADIATION-DAMAGED METALS FROM PRECISION X-RAY LATTICE PARAMETER MEASUREMENTS .1. PRINCIPLES OF THE MEASUREMENTS
    TUCKER, CW
    SAMPSON, JB
    ACTA METALLURGICA, 1954, 2 (03): : 433 - 438
  • [40] EDS Measurements of X-Ray Intensity at WDS Precision and Accuracy Using a Silicon Drift Detector
    Ritchie, Nicholas W. M.
    Newbury, Dale E.
    Davis, Jeffrey M.
    MICROSCOPY AND MICROANALYSIS, 2012, 18 (04) : 892 - 904