Electric field effects in scanning tunnelingmicroscope imaging

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作者：
Stokbro, K. [1 ]
Quaade, U. [1 ]
Grey, F. [1 ]
机构：
[1] Mikroelektronik Centret, Danmarks Tekniske Universitet, Bygning 345ø, DK-2800 Lyngby, Denmark
来源：
Applied Physics A: Materials Science and Processing | 1998年 / 66卷 / SUPPL. 1期
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