Comprehensive x-ray diffraction study of YBa2Cu3O7-δ thin films

被引：0
|
作者：
Moshfegh, A.Z. [1 ]
Fatollahi, A.H. [1 ]
Wang, Y.Q. [1 ]
Sun, Y.Y. [1 ]
Hor, P.H. [1 ]
Ignatiev, A. [1 ]
机构：
[1] Sharif Univ of Technology, Tehran, Iran
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1995年 / 34卷 / 11期
关键词：
23;
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页码：6036 / 6040
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