Dynamic aperture of near-field super resolution structures

被引：1
|
作者：
Tsai, Din Ping [1 ]
Yang, Chi Wen [2 ]
Lin, Wei Chih [2 ]
Ho, Fu Han [2 ]
Huang, Hung Ji [2 ]
Chen, Ming Yish [2 ]
Tseng, Tzu Feng [2 ]
Lee, Chiu Hsiang [2 ]
Yeh, Chwei Jing [2 ]
机构：
[1] Department of Physics, National Taiwan University, Taipei, 10617, Taiwan
[2] Department of Physics, National Chung Cheng University, Chia Yi, 621, Taiwan
来源：
| 2000年 / JJAP, Japan卷 / 39期
关键词：
Laser applications - Optical glass - Optical microscopy - Optical resolving power - Scanning - Silicon nitride;
D O I：
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中图分类号：
学科分类号：
摘要：
Direct experimental observation of the near-field aperture formed in the super resolution near-field structure of glass/SiN(170 nm)/Sb(15 nm)/SiN(20 nm) has been achieved using a tapping-mode tuning-fork near-field scanning optical microscope. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super resolution structure. Images of the near-field intensity gradients at different excited laser powers (0.45-2.33 μW) demonstrated that the area of the static evanescent intensity could be stably controlled.
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