Measurement of bias and temperature characteristics of dielectric materials under different frequency

被引：0
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作者：
Yuan, Zhanheng [1 ]
Zhang, Liangying [1 ]
Yao, Xi [1 ]
机构：
[1] Xi'an Jiaotong Univ, Xi'an, China
来源：
Yadian Yu Shengguang/Piezoelectrics and Acoustooptics | 1999年 / 21卷 / 04期
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页码：318 / 322
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