Nanometer-scale mechanical processing of muscovite mica by atomic force microscope

被引:0
|
作者
Miyake, Shojiro
Ishii, Masanori
Otake, Toshiaki
Tsushima, Naotake
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:426 / 430
相关论文
共 50 条
  • [21] Nanometer-scale photoelectric property of organic thin films investigated by a photoconductive atomic force microscope
    Sakaguchi, Hiroshi
    Iwata, Futoshi
    Hirai, Atsushi
    Sasaki, Akira
    Nagamura, Toshihiko
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1999, 38 (6 B): : 3908 - 3911
  • [22] Nanometer-scale photoelectric property of organic thin films investigated by a photoconductive atomic force microscope
    Sakaguchi, H
    Iwata, F
    Hirai, A
    Sasaki, A
    Nagamura, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (6B): : 3908 - 3911
  • [24] Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscope
    Iwata, F
    Yamaguchi, M
    Sasaki, A
    WEAR, 2003, 254 (10) : 1050 - 1055
  • [25] Moving Au colloidal particles with the tip of an atomic force microscope for the assembly of prototype nanometer-scale devices
    Hartmann, E
    Junno, T
    Carlsson, SB
    Ling, T
    Montelius, L
    Samuelson, L
    PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2, 1999, : 130 - 133
  • [26] Nanometer-scale dimensional metrology with noncontact atomic force microscopy
    Marchman, H
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY X, 1996, 2725 : 527 - 539
  • [27] Studies of surfaces at the nanometer scale with the Atomic Force Microscope
    de Carvalho Lopes, Gerson Anderson
    da Fonseca Filho, Henrique Duarte
    Maguina Zamora, Robert Ronald
    ESTACAO CIENTIFICA-UNIFAP, 2012, 2 (02): : 1 - 9
  • [28] NANOMETER-SCALE LITHOGRAPHY AT HIGH SCANNING SPEEDS WITH THE ATOMIC-FORCE MICROSCOPE USING SPIN ON GLASS
    PARK, SW
    SOH, HT
    QUATE, CF
    PARK, SI
    APPLIED PHYSICS LETTERS, 1995, 67 (16) : 2415 - 2417
  • [29] Measurement of mechanical properties of nanometer scale polymer structures using atomic force microscope
    Kim, Sung-Kyoung
    Shin, Min Kyoon
    Kim, Seon Jeong
    Lee, Haiwon
    IEEE NMDC 2006: IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE 2006, PROCEEDINGS, 2006, : 374 - +
  • [30] Nanometer-scale manipulation and ultrasonic cutting using an atomic force microscope controlled by a haptic device as a human interface
    Iwata, Futoshi
    Ohara, Kouhei
    Ishizu, Yuichi
    Sasaki, Akira
    Aoyama, Hisayuki
    Ushiki, Tatsuo
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (07) : 6181 - 6185