Thin RF sputtered and thermal Ta2O5 on Si for high density DRAM application

被引:0
|
作者
Bulgarian Academy of Sciences, Inst. Solid-Stt. Phys., 72 T., Sofia, Bulgaria [1 ]
机构
来源
Microelectron. Reliab. | / 8卷 / 1185-1217期
关键词
The contributions of my co-authors Dr. T. Dimitrova and Ph.D. student D. Spassov are gratefully acknowledged. This work was partly supported by the Bulgarian Ministry of Science and Education in the frame of Project No. 537;
D O I
暂无
中图分类号
学科分类号
摘要
64
引用
收藏
相关论文
共 50 条
  • [41] Discrete β-Ta2O5 crystallite formation in reactively sputtered amorphous thin films
    P. J. Beckage
    D. B. Knorr
    X. M. Wu
    T.-M. Lu
    E. J. Rymaszewski
    Journal of Materials Science, 1998, 33 : 4375 - 4379
  • [42] Spectroscopic ellipsometry of Ta2O5 on Si
    Richter, CA
    Nguyen, NV
    Alers, GB
    ULTRATHIN SIO2 AND HIGH-K MATERIALS FOR ULSI GATE DIELECTRICS, 1999, 567 : 559 - 566
  • [43] Characterization of Ta2O5 thin films with small current leakage for high density DRAMs
    Kanda, N
    Furukawa, R
    Ishibashi, M
    Kunitomo, M
    Homma, T
    Takahashi, M
    Uemura, T
    Kanai, M
    Kubo, M
    Ogata, K
    Yoshida, T
    Yamamoto, H
    Ohji, Y
    STRUCTURE AND ELECTRONIC PROPERTIES OF ULTRATHIN DIELECTRIC FILMS ON SILICON AND RELATED STRUCTURES, 2000, 592 : 129 - 134
  • [44] Ta2O5 antireflection thin film for photovoltaic application with reactive RF sputtering technique in low vacuum
    Wei, Jinyun
    Liu, Tao
    Taiyangneng Xuebao/Acta Energiae Solaris Sinica, 1998, 19 (03): : 332 - 334
  • [45] Ionizing radiation effects on electrical and reliability characteristics of sputtered Ta2O5/Si interface
    Rao, Ashwath
    Verma, Ankita
    Singh, B. R.
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2015, 170 (06): : 510 - 518
  • [46] EFFECTS OF SURFACE OXIDE ON LEAKAGE CURRENT OF MAGNETRON-SPUTTERED TA2O5 ON SI
    SEKI, S
    UNAGAMI, T
    KOGURE, O
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (12) : 3054 - 3055
  • [47] Crystallization effects in oxygen annealed Ta2O5 thin films on Si
    Dimitrova, T
    Arshak, K
    Atanassova, E
    THIN SOLID FILMS, 2001, 381 (01) : 31 - 38
  • [48] Interface and oxide properties of rf sputtered Ta2O5-Si structures
    Dimitrova, T
    Atanassova, E
    VACUUM, 1998, 51 (02) : 151 - 152
  • [49] Development of Capacitive RF MEMS Switches with TaN and Ta2O5 Thin Films
    Persano, Anna
    Quaranta, Fabio
    Cola, Adriano
    De Angelis, Giorgio
    Marcelli, Romolo
    Siciliano, Pietro
    SMART SENSORS, ACTUATORS, AND MEMS V, 2011, 8066
  • [50] High capacitance density in a Ta2O5 folded capacitor chip
    Houng, MP
    Wang, YH
    Horng, JH
    Hsiang, SJ
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (3A): : 1311 - 1314