Alternative method of measuring modulation depth in CRTs

被引：0
|
作者：
Peterdi, Jeno [1 ]
机构：
[1] Grumman Melbourne Systems Div, Melbourne, United States
来源：
Journal of the Society for Information Display | 1994年 / 2卷 / 01期
关键词：
Display devices - Electron device testing - Electrooptical devices - Measurements - Modulation - Optical resolving power - Signal processing;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A direct method of measuring the modulation depth in high-resolution shadow-mask CRTs is described. The technique uses pulse excitation rather than the square-wave stimulus used by traditional methods.
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页码：15 / 20
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