In situ ultraviolet illumination of porous silicon during scanning tunneling microscopy

被引：0
|
作者：
Schwall, D.
Otter, F.A.
Galligan, J.M.
机构：
来源：
Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena | 1998年 / 16卷 / 04期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] High efficiency blue-green electroluminescence and scanning tunneling microscopy studies of porous silicon
    Kuznetsov, VA
    Andrienko, I
    Haneman, D
    APPLIED PHYSICS LETTERS, 1998, 72 (25) : 3323 - 3325
  • [22] Scanning tunneling microscopy studies of porous and oxidized Zn
    Chang, Sung-Sik
    Sakai, Akira
    EXPERIMENTAL MECHANICS IN NANO AND BIOTECHNOLOGY, PTS 1 AND 2, 2006, 326-328 : 373 - 376
  • [23] Holders for in situ treatments of scanning tunneling microscopy tips
    Ishida, Nobuyuki
    Subagyo, Agus
    Ikeuchi, Akira
    Sueoka, Kazuhisa
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (09):
  • [24] Scanning tunneling microscopy investigations of silicon carbide nanowires
    Busiakiewicz, A.
    Klusek, Z.
    Huczko, A.
    Kowalczyk, P. J.
    Dabrowski, P.
    Kozlowski, W.
    Cudzilo, S.
    Datta, P. K.
    Olejniczak, W.
    APPLIED SURFACE SCIENCE, 2008, 254 (14) : 4268 - 4272
  • [25] SCANNING TUNNELING MICROSCOPY OF SILVER AND GOLD ISLANDS ON SILICON
    WARMACK, RJ
    FERRELL, TL
    BECKER, RS
    PHYSICA SCRIPTA, 1988, 38 (02): : 159 - &
  • [26] Scanning tunneling microscopy on ultrathin silicon on insulator (100)
    Sutter, P
    Ernst, W
    Sutter, E
    APPLIED PHYSICS LETTERS, 2004, 85 (15) : 3148 - 3150
  • [27] PHOTOVOLTAGE ON SILICON SURFACES MEASURED BY SCANNING TUNNELING MICROSCOPY
    KUK, Y
    BECKER, RS
    SILVERMAN, PJ
    KOCHANSKI, GP
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 545 - 550
  • [28] SCANNING TUNNELING MICROSCOPY ON CLEAVED SILICON PN JUNCTIONS
    KORDIC, S
    VANLOENEN, EJ
    DIJKKAMP, D
    HOEVEN, AJ
    MORAAL, HK
    1989 INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, 1989, : 277 - 280
  • [29] On the modification of a silicon surface studied by scanning tunneling microscopy
    V. M. Kornilov
    A. N. Lachinov
    Semiconductors, 2003, 37 : 307 - 311
  • [30] On the modification of a silicon surface studied by scanning tunneling microscopy
    Kornilov, VM
    Lachinov, AN
    SEMICONDUCTORS, 2003, 37 (03) : 307 - 311
12345