The Method of Alpha-Correction Factors in X-ray Spectral Microanalysis: Ternary Systems

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Lavrent'ev, Y. G.

Usova, L. V.

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Journal of Analytical Chemistry | / 53卷 / 01期

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ILIN, NP
LOSEVA, LE
INDUSTRIAL LABORATORY, 1967, 33 (08): : 1122 - &
[22] MODEL OF EFFECTIVE DEPTH IN X-RAY SPECTRAL MICROANALYSIS
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BERDICHEVSKII, GV
CHERNYAVSKII, LI
INDUSTRIAL LABORATORY, 1979, 45 (11): : 1225 - 1231
[23] CALCULATION OF SUPERPOSITIONING OF SPECTRAL-LINES IN X-RAY SPECTRAL MICROANALYSIS
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INDUSTRIAL LABORATORY, 1979, 45 (06): : 657 - 658
[24] THE PARAMETERLESS CORRECTION METHOD IN X-RAY-MICROANALYSIS
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[25] X-RAY OPTICS AND X-RAY MICROANALYSIS
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[26] X-RAY OPTICS + X-RAY MICROANALYSIS
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[29] X-RAY MICROSCOPY AND X-RAY MICROANALYSIS
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NATURE, 1959, 184 (4690) : 860 - 862
[30] INVESTIGATION OF DIFFUSION IN SUBMICRON SURFACE-LAYERS BY THE X-RAY SPECTRAL MICROANALYSIS METHOD
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