Effect of Y-doping on resistance degradation of multilayer ceramic capacitors with Ni electrodes under the highly accelerated life test

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作者：
Sato, Shigeki [1 ]
Nakano, Yukie [1 ]
Sato, Akira [1 ]
Nomura, Takeshi [1 ]
机构：
[1] TDK Corp, Narita, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1997年 / 36卷 / 9 B期
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页码：6016 / 6020
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