X-RAY DIFFRACTION STUDY OF Na2O-GeO2 MELTS.

被引：0
|
作者：
Kamiya, Kanichi [1 ]
Yoko, Toshinobu [1 ]
Itoh, Yoshitaka [1 ]
Sakka, Sumio [1 ]
机构：
[1] Mie Univ, Dep of Industrial, Chemistry, Tsu, Jpn, Mie Univ, Dep of Industrial Chemistry, Tsu, Jpn
来源：
| 1600年 / 79期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
GLASS
引用
收藏
相关论文
共 50 条
  • [41] In situ X-ray and neutron diffraction study of Ba2In2O5
    Speakman, SA
    Misture, ST
    EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2001, 378-3 : 336 - 339
  • [42] X-ray diffraction study on microstructure of Li2O-TeO2 glasses
    Iwadate, Y
    Hattori, T
    Nishiyama, S
    Fukushima, K
    Sugawara, Y
    Nakazawa, T
    Noda, K
    Tatsumisago, M
    Umesaki, N
    NIPPON KAGAKU KAISHI, 1998, (07) : 460 - 464
  • [43] Chromites YbMCr2O5 (M = Li, Na, K, Cs): X-ray diffraction study
    B. B. Tumataeva
    B. K. Kasenov
    S. Zh. Davrenbekov
    E. S. Mustafin
    Zh. I. Sagintaeva
    Sh. B. Kasenova
    S. T. Edil’baeva
    Russian Journal of Inorganic Chemistry, 2009, 54 : 27 - 29
  • [44] Chromites YbMCr2O5 (M = Li, Na, K, Cs): X-Ray Diffraction Study
    Tumataeva, B. B.
    Kasenov, B. K.
    Davrenbekov, S. Zh.
    Mustafin, E. S.
    Sagintaeva, Zh. I.
    Kasenova, Sh. B.
    Edil'baeva, S. T.
    RUSSIAN JOURNAL OF INORGANIC CHEMISTRY, 2009, 54 (01) : 27 - 29
  • [45] High resolution x-ray diffraction and x-ray topography study of GaN on Al2O3
    Chaudhuri, J
    Ng, MH
    Koleske, DD
    Wickenden, AE
    Henry, RL
    WIDE-BANDGAP SEMICONDUCTORS FOR HIGH POWER, HIGH FREQUENCY AND HIGH TEMPERATURE, 1998, 512 : 315 - 320
  • [46] X-ray diffraction study of the CuCr2O4-NiFe2O4 system
    V. V. Ivanov
    V. M. Talanov
    N. P. Shabel’skaya
    Inorganic Materials, 2000, 36 : 1167 - 1172
  • [47] X-ray diffraction study of the CuCr2O4-NiFe2O4 system
    Ivanov, VV
    Talanov, VM
    Shabel'skaya, NP
    INORGANIC MATERIALS, 2000, 36 (11) : 1167 - 1172
  • [48] Thermal and X-ray diffraction studies on Na2MoO4, Na2Mo2O7 and Na2Mo4O13
    Mudher, KDS
    Keskar, M
    Krishnan, K
    Venugopal, V
    JOURNAL OF ALLOYS AND COMPOUNDS, 2005, 396 (1-2) : 275 - 279
  • [49] X-ray and neutron scattering rheology: Crystallization from sheared melts.
    Mitchell, GR
    Holt, JJ
    Thornley, SA
    Chai, CK
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 222 : U344 - U344
  • [50] X-RAY-DIFFRACTION STUDY OF NA2S2O6.2H2O AND NA2S2O6.2D2O
    KIRFEL, A
    WILL, G
    WEISS, A
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1980, 36 (FEB): : 223 - 228
12345