Multilayer HTS SFQ analog-to-digital converters

被引：0

作者：

McCambridge, James D. ^{[1
]}

Forrester, Martin G. ^{[1
]}

Miller, Donald L. ^{[1
]}

Hunt, Brian D. ^{[1
]}

Pryzbysz, John X. ^{[1
]}

Talvacchio, John ^{[1
]}

Young, Robert M. ^{[1
]}

机构：

[1] Northrop Grumman Science &, Technology Cent, Pittsburgh, United States

来源：

IEEE Transactions on Applied Superconductivity | 1997年 / 7卷 / 2 pt 3期

关键词：

Critical currents - Digital circuits - Flip flop circuits - Grain boundaries - High temperature superconductors - Josephson junction devices - Multilayers - Oxide superconductors - SQUIDs;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We have fabricated and measured high Tc superconductor single flux quantum 1-bit flux-counting analog-to-digital converters (ADCs). The ADCs were made with a multilayer all-epitaxial process which incorporates 10 edge SNS (superconductor-normal-superconductor) or step-edge grain boundary (SEGB) Josephson junctions with a YBa2Cu3O7-δ groundplane. The ADC consists of a quantizer connected to a Toggle flip-flop through a buffer-like stage. Direct readout of the flux state of the T flip-flop was made with a Read SQUID inductively coupled through a hole in the groundplane. The circuits were operated at 65 K and low speeds. The SNS circuits outperformed the SEGB circuits because of their higher readout voltages and tighter critical current spreads.

引用

页码：3622 / 3625

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