X-RAY SPECTROSCOPIC INVESTIGATION OF THE ELECTRON STRUCTURE OF SILICON AND ALUMINUM OXIDES.

被引：0
|
作者：
Brytov, I.A.
Romashchenko, Yu.N.
机构：
来源：
| 1978年 / 20卷 / 03期
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Compendex;
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摘要：
SILICON COMPOUNDS
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页码：384 / 389
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