Effect of film thickness on stress and transformation behavior in cobalt thin films

被引：0
|
作者：
Hesemann, H.Th. [1 ]
Muellner, P. [1 ]
Kraft, O. [1 ]
Arzt, E. [1 ]
机构：
[1] Universitaet Stuttgart, Stuttgart, Germany
来源：
Materials Research Society Symposium - Proceedings | 2000年 / 594卷
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摘要：
10
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页码：219 / 224
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