Parametric yield estimation of GaAs/AlGaAs multiple quantum well avalanche photodiodes using neural networks

被引：0
|
作者：
Yun, Ilgu [1 ]
May, Gary [1 ]
机构：
[1] Georgia Inst of Technology, Atlanta, GA, United States
来源：
Intelligent Engineering Systems Through Artificial Neural Networks | 1997年 / 7卷
关键词：
1997_021717_299_6.xlsx;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Photodiodes - Probability density function - Probability distributions - Semiconductor quantum wells
引用
收藏
页码：845 / 853
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