Approximate method for calculating thickness of metal multilayer interface

被引：0
|
作者：
Feng, Shimeng [1 ]
Yi, Kui [1 ]
Shao, Jianda [1 ]
Fan, Zhengxiu [1 ]
机构：
[1] Shanghai Inst of Optics and Fine, Mechanics, Chinese Acad of Sciences, Shanghai, China
来源：
Guangxue Xuebao/Acta Optica Sinica | 2000年 / 20卷 / 09期
关键词：
Interface thickness - Transfer layer;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
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页码：1208 / 1212
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