共 50 条
- [42] X-ray spectroscopic study of electronic structure of amorphous silicon and silicyne Semiconductors, 2001, 35 : 956 - 961
- [44] X-ray photoelectron spectroscopic study of rare-earth-doped amorphous silicon-nitrogen films Zanatta, A.R. (zanatta@if.sc.usp.br), 1948, American Institute of Physics Inc. (93):
- [47] IR SPECTROSCOPY AND X-RAY TOPOGRAPHY STUDY OF ANNEALING OF PROTON BOMBARDED SILICON PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 66 (02): : K101 - &
- [48] X-Ray adsorption spectroscopic on hyper-doped silicon for high-efficiency photovoltaics Galvanotechnik, 2010, 101 (09): : 2104 - 2108
- [49] X-RAY SPECTROSCOPIC STUDY OF THE DISTRIBUTION OF GERMANIUM IONS IMPLANTED IN SILICON. 1981, (N 7): : 14 - 17