Light emission from highly reflective porous silicon multilayer structures

被引:0
|
作者
Squire, E.K. [1 ]
Snow, P.A. [1 ]
Russell, P.St.J. [1 ]
Canham, L.T. [2 ]
Simons, A.J. [2 ]
Reeves, C.L. [2 ]
Wallis, D.J. [2 ]
机构
[1] Optoelectronics Group, Department of Physics, University of Bath, Claverton Down, Bath, BA2 7AY, United Kingdom
[2] Defence Evaluation and Research Agency, St. Andrews Road, Malvern, WR14 3PS, United Kingdom
关键词
Crystal microstructure - Electroluminescence - Light reflection - Light transmission - Optical films - Optical multilayers - Photoluminescence - Porosity - Superlattices;
D O I
10.1023/a:1009694906324
中图分类号
学科分类号
摘要
Porous silicon photoluminescence and electroluminescence can be controlled by periodically modulating the material porosity to form high quality multilayer stacks and microcavities. Important issues not yet fully addressed are (a) the precise role played by this microstructuring, given that the luminescence is distributed throughout the entire structure and that the low porosity layers are highly absorbing at short wavelengths, and (b) whether the quality of such microcavities could be sufficient to support lasing. Using both experimental and theoretical techniques, the emission and reflection properties of different porous silicon single and multilayer structures have been investigated in order to understand further and exploit the nature of light propagation within them.
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页码:209 / 213
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