APPLICATION OF MICRO-COMPUTER TO LSI AUTOMATIC TEST SYSTEM.

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作者
Kobayashi, Nobuyoshi
Katsuta, Noriyuki
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COMPUTERS; MICROPROCESSOR - Applications - INTEGRATED CIRCUITS - Large Scale Integration;
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This article describes the SXI-018 automatic test system developed to meet the needs of LSI users for a compact, universal and inexpensive LSI tester. Compact equipment, including a check table, with efficient programmability and a high ratio of performance to cost has been achieved by adopting the comparative method with a standard LSI and using the 16-bit micro-processor MN1610. This system has other convenient advantages, such as a programmable power supply controlled by a micro-computer, which enable it to simulate the working condition for each LSI, and a comparator-open-switch effectively analyzes defective LSI's.
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页码:1112 / 1120
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