Techniques of image-based surface details

被引:0
|
作者
Wang, Z.Y.
Chen, Z.M.
Lu, Y.Q.
机构
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] Developing Image-Based Classification Techniques to Analyse Customer Behaviour
    Butler, Ryan
    Simpson, Edwin
    AGENTS AND ARTIFICIAL INTELLIGENCE, ICAART 2023, 2024, 14546 : 469 - 491
  • [32] A critical analysis of image-based camera pose estimation techniques
    Xu, Meng
    Wang, Youchen
    Xu, Bin
    Zhang, Jun
    Ren, Jian
    Huang, Zhao
    Poslad, Stefan
    Xu, Pengfei
    NEUROCOMPUTING, 2024, 570
  • [33] A review of image-based automatic facial landmark identification techniques
    Benjamin Johnston
    Philip de Chazal
    EURASIP Journal on Image and Video Processing, 2018
  • [34] Image-based multiresolution shape recovery by surface deformation
    Zhang, L
    Seitz, SM
    VIDEOMETRICS AND OPTICAL METHODS FOR 3D SHAPE MEASUREMENT, 2001, 4309 : 51 - 61
  • [35] Image-Based System for Measuring Objects on an Oblique Surface
    Hsu, Chen-Chien
    Wang, Wei-Yen
    Lu, Yin-Yu
    Lu, Ming-Chi
    2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS, 2010,
  • [36] Image-Based Automated Width Measurement of Surface Cracking
    Carrasco, Miguel
    Araya-Letelier, Gerardo
    Velazquez, Ramiro
    Visconti, Paolo
    SENSORS, 2021, 21 (22)
  • [37] Review of image-based river surface velocimetry research
    Yang D.
    Shao G.-J.
    Hu W.-F.
    Liu G.-F.
    Liang J.-M.
    Wang H.-L.
    Xu C.
    Zhejiang Daxue Xuebao (Gongxue Ban)/Journal of Zhejiang University (Engineering Science), 2021, 55 (09): : 1752 - 1763
  • [38] Android malware detection based on image-based features and machine learning techniques
    Unver, Halil Murat
    Bakour, Khaled
    SN APPLIED SCIENCES, 2020, 2 (07):
  • [39] Android malware detection based on image-based features and machine learning techniques
    Halil Murat Ünver
    Khaled Bakour
    SN Applied Sciences, 2020, 2
  • [40] Novel electron-beam image-based failure localization techniques
    Tsujide, T
    MICROELECTRONIC ENGINEERING, 1996, 31 (1-4) : 69 - 77