AUGER ELECTRON SPECTROSCOPY STUDY OF AlxIn1 - xN THIN FILM HOMOGENEITY.

被引：0

作者：

Starosta, K. ^{[1
]}

Marsik, J. ^{[1
]}

机构：

[1] Czechoslovak Acad of Sciences, Inst, of Radio Engineering &, Electronics, Prague, Czech, Czechoslovak Acad of Sciences, Inst of Radio Engineering & Electronics, Prague, Czech

来源：

| 1600年 / 128期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

ALUMINUM AND ALLOYS

引用

页码：1 / 2

共 50 条

[41] QUANTITATIVE-ANALYSIS OF THIN FILM-SUBSTRATE INTERDIFFUSION BY GDOS AND BY AUGER-ELECTRON SPECTROSCOPY
WEISS, Z
SUBA, J
CZECHOSLOVAK JOURNAL OF PHYSICS, 1992, 42 (05) : 539 - 544
[42] PASSIVE FILM ON IRON - APPLICATION OF AUGER-ELECTRON SPECTROSCOPY
REVIE, RW
BAKER, BG
BOCKRIS, JOM
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (11) : 1460 - 1466
[43] STUDY OF THE NUCLEATION PROCESS IN THIN FILMS BY THE AUGER-ELECTRON SPECTROSCOPY METHOD.
Tyuliyev, G.T.
Yelovikov, S.S.
Dubinina, Ye.M.
Radio Engineering and Electronic Physics (English translation of Radiotekhnika i Elektronika), 1981, 26 (10): : 101 - 104
[44] AUGER-ELECTRON SPECTROSCOPY AND SPUTTER AUGER ANALYSES OF THIN-FILMS OF SICX
MORGEN, P
SEAWARD, KL
BARBEE, TW
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (06): : 2108 - 2115
[45] AUGER-ELECTRON SPECTROSCOPY OF LA THIN-FILMS
ADAMCHUK, VK
FEDOROV, AV
SHIKIN, AM
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1991, 55 (12): : 2294 - 2297
[46] MATERIAL ANALYSIS OF THIN FOILS BY AUGER ELECTRON-SPECTROSCOPY
SEILER, H
WIEDMANN, P
OPTIK, 1976, 44 (04): : 505 - 507
[47] Material Analysis of Thin Foils by Auger Electron-Spectroscopy.
Seiler, H.
Wiedmann, P.
1600, (44):
[48] ION-SCATTERING SPECTROSCOPY AND AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILES OF SILVER COPPER THIN-FILM INTERDIFFUSION
PITTS, JR
CZANDERNA, AW
THOMAS, TM
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1671 - 1674
[49] A COMPARATIVE-STUDY OF THIN-FILM DIFFUSION MEASUREMENTS IN METALLIC GLASSES BY RUTHERFORD BACKSCATTERING SPECTROMETRY AND AUGER-ELECTRON SPECTROSCOPY
SHARMA, SK
BANERJEE, S
KULDEEP
JAIN, AK
THIN SOLID FILMS, 1988, 164 : 33 - 36
[50] Study of Thin Film Tungsten Oxide Electrochromes by UV and IR Absorption and Auger Spectroscopy.
Le Bihan, R.
Grandet, G.
Vide, les Couches Minces, 1984, 39 (222): : 213 - 217

← 1 2 3 4 5 →