AUGER ELECTRON SPECTROSCOPY STUDY OF AlxIn1 - xN THIN FILM HOMOGENEITY.

被引:0
|
作者
Starosta, K. [1 ]
Marsik, J. [1 ]
机构
[1] Czechoslovak Acad of Sciences, Inst, of Radio Engineering &, Electronics, Prague, Czech, Czechoslovak Acad of Sciences, Inst of Radio Engineering & Electronics, Prague, Czech
来源
| 1600年 / 128期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
ALUMINUM AND ALLOYS
引用
收藏
页码:1 / 2
相关论文
共 50 条
  • [1] AUGER-ELECTRON SPECTROSCOPY STUDY OF ALXIN1-XN THIN-FILM HOMOGENEITY
    STAROSTA, K
    MARSIK, J
    THIN SOLID FILMS, 1985, 128 (1-2) : L41 - L43
  • [2] Optical Mueller matrix modeling of chiral AlxIn1 - xN nanospirals
    Magnusson, Roger
    Birch, Jens
    Sandstrom, Per
    Hsiao, Ching-Lien
    Arwin, Hans
    Jarrendahl, Kenneth
    THIN SOLID FILMS, 2014, 571 : 447 - 452
  • [3] High-pressure phases of AlxIn1−xN compounds: First principles calculations
    Robin Chang, Yee Hui
    Yoon, Tiem Leong
    Lim, Thong Leng
    Tuh, Moi Hua
    Journal of Alloys and Compounds, 2017, 704 : 160 - 169
  • [4] THIN FILM ANALYSIS BY AUGER ELECTRON SPECTROSCOPY
    WEBER, RE
    SOLID STATE TECHNOLOGY, 1970, 13 (12) : 49 - &
  • [5] Photoelectrochemical behavior of AlxIn1−xN thin films grown by plasma-assisted dual source reactive evaporation
    Alizadeh, M. (alizadeh_kozerash@yahoo.com), 1600, Elsevier Ltd (670):
  • [6] Physical properties of AlxIn1-xN thin film alloys sputtered at low temperature
    Besleaga, C., 1600, American Institute of Physics Inc. (116):
  • [7] Physical properties of AlxIn1-xN thin film alloys sputtered at low temperature
    Besleaga, C.
    Galca, A. C.
    Miclea, C. F.
    Mercioniu, I.
    Enculescu, M.
    Stan, G. E.
    Mateescu, A. O.
    Dumitru, V.
    Costea, S.
    JOURNAL OF APPLIED PHYSICS, 2014, 116 (15)
  • [8] AUGER-ELECTRON SPECTROSCOPY FOR THIN-FILM ANALYSIS
    WEBER, RE
    RESEARCH-DEVELOPMENT, 1972, 23 (10): : 22 - &
  • [9] Quantitative Auger electron spectroscopy in thin film depth profiling
    Max-Planck-Inst fuer Metallforschung, Stuttgart, Germany
    Vacuum, 7-9 (607-612):
  • [10] Quantitative Auger electron spectroscopy in thin film depth profiling
    Hofmann, S
    VACUUM, 1997, 48 (7-9) : 607 - 612