LOW ENERGY ELECTRON DIFFRACTION AND X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES OF THE FORMATION OF SUBMONOLAYER INTERFACES OF Sb/Si(111).

被引：0
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作者：
Park, Chong-Yun [1 ]
Abukawa, Tadashi [1 ]
Kinoshita, Toyohiko [1 ]
Enta, Yoshiharu [1 ]
Kono, Shozo [1 ]
机构：
[1] Tohoku Univ, Sendai, Jpn, Tohoku Univ, Sendai, Jpn
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes | 1988年 / 27卷 / 01期
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摘要：
5
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页码：147 / 148
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