Emittance measurement of a high brightness pseudospark-produced electron beam

被引：0
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作者：
Huang, Yu [1 ]
Wang, Mingchang [1 ]
Zhang, Lifen [1 ]
Lu, Bin [1 ]
Feng, Chengshi [1 ]
Zhou, Huifen [1 ]
机构：
[1] Shanghai Inst of Optics & Fine, Mechanics, Chinese Acad of Sciences, Shanghai, China
来源：
| 1996年 / 16期
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7
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