Materials Testing with X-Ray Backscattering.

被引:0
|
作者
Kosanetzky, J.
Harding, G.
机构
来源
Materialpruefung/Materials Testing | 1987年 / 29卷 / 7-8期
关键词
MATERIALS TESTING - Nondestructive Examination - X-RAYS - Scattering;
D O I
暂无
中图分类号
学科分类号
摘要
The use of Compton scattered X-rays for nondestructive testing of new materials such as aluminum castings and plastic materials is described. Scatter imaging can provide several advantages over conventional shadow projections: high defect contrast, 3D information concerning the spatial localization of defects, and relatively free choice of the imaging geometry. These advantages are illustrated by a novel x-ray backscatter system. Results are presented for several application areas in the automobile industry as well as in the aircraft and plastic industries.
引用
收藏
页码:217 / 221
相关论文
共 50 条
  • [31] X-ray generation at SPARC LAB Thomson backscattering source
    Giribono, Anna
    NUOVO CIMENTO C-COLLOQUIA AND COMMUNICATIONS IN PHYSICS, 2015, 38 (02):
  • [32] Backscattering X-ray imaging using Fresnel zone aperture
    Shimura, Takayoshi
    Hosoi, Takuji
    Watanabe, Heiji
    APPLIED PHYSICS EXPRESS, 2021, 14 (07)
  • [33] Backscattering X-ray imaging using Fresnel zone aperture
    Shimura, Takayoshi
    Hosoi, Takuji
    Watanabe, Heiji
    Applied Physics Express, 2021, 14 (07):
  • [34] X-ray backscattering (diffraction at a Bragg angle of π/2): A review
    V. V. Lider
    Crystallography Reports, 2012, 57 : 628 - 647
  • [35] X-ray backscattering (diffraction at a Bragg angle of π/2): A review
    Lider, V. V.
    CRYSTALLOGRAPHY REPORTS, 2012, 57 (05) : 628 - 647
  • [36] Concept study X-ray testing for NICER's X-ray concentrators
    Balsamo, Erin
    Gendreau, Keith
    Arzoumanian, Zaven
    Okajima, Takashi
    Jalota, Lalit
    Soong, Yang
    Serlemitsos, Peter
    Enoto, Teruaki
    Gulati, Bhalvinder
    Kenyon, Steve
    Hahne, Devin
    Fickau, David
    Spartana, Nicholas
    Lentine, Steve
    Burdhimo, Ceili
    Barrios, Billy
    Wu, Lisa
    OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY VI, 2013, 8861
  • [37] Influence of backscattering on the spatial resolution of semiconductor X-ray detectors
    Hoheisel, M
    Korn, A
    Giersch, J
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 546 (1-2): : 252 - 257
  • [38] X-ray Compton backscattering imaging via structured light
    Salazar, Edgar
    Liu, Xiaokang
    Arce, Gonzalo
    OPTICS EXPRESS, 2022, 30 (09) : 15211 - 15226
  • [39] TESTING STEEL WITH AN X-RAY TELEVISION SYSTEM BASED ON X-RAY VIDICONS
    SEMENOV, AP
    VOLKOV, AV
    SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR, 1977, 13 (03): : 245 - 249
  • [40] RADIOGRAPHIC CONTROL OF MATERIALS TESTING REACTOR-FUEL ON X-RAY PAPER
    DOMANUS, JC
    NUCLEAR TECHNOLOGY, 1977, 36 (02) : 187 - 192